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New Release Boosts Semiconductor Quality Control

Tackling Defects with Data: New Release Boosts Semiconductor Quality Control

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Semiconductors power the modern world, yet producing them demands near-perfect precision. In a world of microscopic margins and relentless innovation, even the smallest defect can ripple into massive consequences.

To address challenges around microscopic defects and process inefficiencies in a way that meets stringent quality standards, we are introducing a cutting-edge solution for defect and wafer mapping. This addition to our platform brings unparalleled insights into the semiconductor production processes and enables manufacturers to tackle critical issues head-on.

Defect Collection, Reinvented

Defect management is the backbone of semiconductor manufacturing. This integration into our TME® makes it far easier to do. 

For starters, say goodbye to rigid defect classifications. Our solution improves production quality with a customizable defect library, so you can tailor defect classifications to your exact needs, categorize issues unique to your processes, and maintain a robust repository of scrap codes to monitor recurring problems.

But it doesn’t stop there. Imagine spotting a defect pattern across batches in real time. Our platform brings your production challenges to life with dynamic visualizations that reveal problem areas across batches or wafers. At a glance, your teams can spot recurring defects, identify hidden trends in production data, and act swiftly to resolve issues before they escalate.
With our new visualization tools in TME® dashboards, you can pinpoint the root cause and prevent costly downtime within hours instead of days. Heat maps give you a clearer picture of production, helping your teams tackle issues faster and more effectively. Pareto charts support your quality analysis efforts and give you the ability to identify the location of problem batches and dig into the causes of your most common defects.

The result? Smarter decisions, higher-quality products, and less waste.

Applications That Drive Excellence

Our defect and wafer mapping solution elevates every aspect of semiconductor manufacturing, from quality control to process optimization.

  • Quality Control: Real-time defect tracking ensures only top-tier products leave the production line, minimizing costly recalls and rework.
  • Root Cause Analysis: Makes it easier to trace defects back to their source, implement corrective actions, and prevent recurring issues.
  • Process Optimization: Lets you streamline workflows, eliminate bottlenecks, and unlock productivity gains that boost your bottom line.

By addressing challenges at every stage, we empower you to deliver flawless results while driving continuous improvement.

MES for Semiconductor Manufacturers: A Game-Changer

In a high-stakes industry like semiconductor manufacturing, precision is non-negotiable. Gain unmatched visibility and control over your operations with our expanded defect and wafer mapping functionality, alongside new features and other enhancements tailored specifically to your needs.

Our platform now offers an expanded range of visualization tools in TME® dashboards, including advanced chart types like line, scatter, and waterfall, all customizable for deeper analysis of your production data. The defect collection tools have also been upgraded with a customizable defect code library, wafer map rendering for interactive review, and heat maps with time-based filtering to pinpoint quality issues with precision. A new Defect Collection API ensures seamless integration of equipment data into your workflows.

We’ve also improved user input and data integrity through required field validations. We’ve expanded functionality for sales orders and WIP management to streamline workflows and eliminate inefficiencies. Updated sandbox and data import tools make configuration and scaling more seamless, while inventory permissions enable tighter control over item visibility.
These innovations are complemented by real-time visualization of defect and wafer data, comprehensive analytics to track performance metrics, and scalable tools designed to grow with your manufacturing needs. By empowering you to tackle defects with confidence and optimize every stage of your processes, our platform continues to drive innovation and excellence in semiconductor production.

TME® 7.5.4 Release Notes:

  1. New Charts & Gadgets 

    • New visuals now available, creating richer analytics with your TME data right in your dashboards.
      • Includes Line, Bar, Scatter, Pie, Area, Bubble, Donut, Funnel, Radar, PolarScatter and Waterfall.
    • Configurable and customizable data sources, for endless capabilities and slicing of your TME data
    • Design your charts with fixed or variable sized chart Series for a deeper analysis of your data.

  2. Improve Quality with digital Defect Collection.

    • Customizable Defect Code Library to fit your Quality Standards
      • Filter Defect Codes per Operation, streamlining the reporting process
    • Semiconductor: Wafer Map rendering now available in Defect Collection
      • Allow operator interactively collect and review defects on your Wafer Map
      • Wafer Map “Heat Map” diagram, showing color coding of issues
        1. Filter the Heat Map by time to home in on quality incidents
    • New Defect Collection API available to integrate defect data from your equipment

  3. Improve User Input and Data Integrity

    • Added “Required Field” validations to prevent saving items with empty or missing essential fields (Name, Value, or ID).
    • Addressed numerous instances across TME where blank or empty entries were allowed, such as:
      • Locale diagrams, RFID configurations, Asset Management, Inventory, WIP, Contacts, and Scheduling modules.
      • Specific validations added for categories, attributes, and transaction rules across modules.

  4. Sales Orders Module

    • Enhanced functionality for WIP work orders:
      • Automatically create multiple work orders from a single Sales Order line item.
      • Additional Sales Order reference fields in both WIP Work Order and Grid Views.

  5. WIP Module

    • Leverage new Run rule Actions (“GoTo” and “ChangeTo”) in WIP Data Collection based on run rule violations.
    • Improved handling of asset start/stop serial numbers to streamline user input.

  6. Sandbox and Data Import Tools

    • Updated the sandbox and data import tools for additional fields and configurations added to TME.

  7. Inventory Online Ordering Catalog

    • New Permission for “Items”: Restrict-Visibility 
    • Minor enhancements to screens.

The Root Cause Podcast

Curious about the deeper story behind these advancements? Tune in to our latest episode of The Root Cause Podcast, where we explore the inspiration and impact of these new features—don’t miss it!

See It in Action

Defects shouldn’t define your production outcomes. With our cutting-edge defect and wafer mapping solution, you’ll transform challenges into opportunities for precision, efficiency, and quality.

From real-time defect visualization to customizable libraries and advanced analytics, our platform empowers you to act faster, produce smarter, and optimize every process.

Don’t let defects hold you back. Schedule your demo now.